Chemical Force Microscopy |
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Chemical Force Microscopy (CFM) allows scientists at the Polymer Centre to evaluate forces of attraction between molecules directly. The technique is based on Atomic Force Microscopy (AFM), where a very fine tip (one atom wide!) records the physical surface of the material. This technique is modified in Chemical Force Microscopy (CFM) by coating the AFM tip with an ordered monolayer of one of the compounds of interest, and the target surface with the other. The force of attraction can be estimated from the excess force required to pull the tip free from the surface, as shown in the animation (above). Over the last few years we've created a number of animations illustrating aspects of polymer science for the Polymer Centre. You can see these on their site: Return to animations |